2 Characterization of the crystallization kinetics
As we discussed above, intensively structure evolution occurs during
film-forming process and post-treatment process, which determines the
final morphology of the active layer. Therefore, monitoring structure
evolution is conducive to analyze the crystallization kinetics. In situ
characterizations are powerful tools to extract real-time structural
information, where the in situ optical spectrum and X-ray scattering are
frequently utilized with customized film-forming setup.
In the following paragraph, we
briefly summarize various common measurements, such as ultraviolet
visible absorption spectroscopy (UV-vis) absorption spectra,
photoluminescence (PL), grazing-incidence wide-angle X-ray scattering
(GIWAXS), and grazing incidence small-angle X-ray scattering (GISAXS).
Then, we emphasize their significance and refer to classic examples to
elucidate the information derived from each in situ characterization
technique.