Morphological analysis
The samples (μL) were drop-casted on a clean silicon wafer (10 mm × 10
mm) for the analysis of their morphology. The samples were first
concentrated using a centricon filter and then diluted about 100 folds
using Milli-Q water. The casted samples were then left inside the
laminar air flow for about 2-3 hrs for removing the moisture. These
dried samples were scanned in non-contact mode using an Oxford Asylum
Atomic force microscope (Oxford, Asylum) equipped with a silicon nitride
tip (Elofsson et al. 1997)
All the experiments were performed in triplicates and their mean ±
standard deviation data are presented.