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Fractal pull-in instability for a micro-electromechanical device with a current-carrying conductor
  • Dan Tian,
  • Qura-Tul Ain,
  • Naveed Anjum
Dan Tian
Xi'an University of Architecture and Technology
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Qura-Tul Ain
Soochow University
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Naveed Anjum
Soochow University
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Abstract

Pull-in effect always occurs in a micro-electromechanical system, and its pull-in analysis is essential for the normal operation. This paper aims at studying the environment effect on the pull-in instability, especially the nano/micro particles in air. A fractal model is established using a fractal derivative, and the pull-in instability can be converted into a novel state of pull-in stability when the fractal dimension tends to be very small.